Polytec.llc

Events / Online Presentations

  • Recording --> Improving Performance of MEMS Designs Using Dynamic Characterization Panelist: Eric Lawrence Thursday, 18-Mar-2010

    Learn how Polytec's latest technology is used for cutting edge applications in the field of Micro-Electro-Mechanical Structures (MEMS). Our Micro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibrations of

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  • Recording --> Low-invasive Estimation of Actual Physical Properties in Microsystems Panelist: Dr. Swavik Spiewak Wednesday, 18-Aug-2010

    Model based estimation is usually the only option for low-invasive evaluation of the actual properties and performance of MNEMS either in the laboratory tests or in production.

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Technical Papers

Principle of our technology


  • Pages:2   Total Results:7    Result: [1 - 5]    Select Page: 1 | 2

    Nano-Scan Update Report


    Presentation of the latest developments in Nano-Scan technology

    Publishing date: 02/2008
    Author:

    The Dynamics of Surface Curvature and the Head-to-Disk Interface


    A discussion of the dynamics of the disk, the distortions that occur in use and the effect on the head-to-disk interface, importantly, the fly height modulation.

    Publishing date: 05/2004
    Author: Jim Eckerman and Dr. James Chao

    more information (352 KB / .pdf) »

    Higher Density, Higher Performance


    In the hard disk drive segment of the data storage industry, the challenges to understand the mechanical interactions are extreme as the fight for micro-inch control has progressed to nano-meters, Angstroms and now to understanding tenths of Angstroms.

    Publishing date: 02/2004
    Author: Jim Eckerman

    more information (489 KB / .pdf) »

    Scattered Thoughts


    A discussion of scatter technology, design considerations and limitations.

    Publishing date: 01/2004
    Author: Steven Miller, Breault Research

    more information (89 KB / .pdf) »

    The Next Generation of Dynamic Rotational Testers


    This paper describes laser Doppler vibrometry applied to making single point spindle measurements with extreme accuracy for synchronous and non-synchronous error motions in both axial and radial planes and a method of examining total body motion.

    Publishing date: 01/2003
    Author: Jim Eckerman

    more information (639 KB / .pdf) »



Latest News

Polytec announces the first morphology and defect tester based on advanced vibrometry.
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Polytec USA LLC was awarded the prestigious Nano Technology Award for Nano-Scan at the NASA sponsored National Nano Engineering Conference. This year’s winners include the THôT Model 42000 Scanner with Nano-Scan defect detection. Polytec Inc....
more information [Download PDF]