Polytec.llc

Events / Online Presentations

  • Recording --> Improving Performance of MEMS Designs Using Dynamic Characterization Panelist: Eric Lawrence Thursday, 18-Mar-2010

    Learn how Polytec's latest technology is used for cutting edge applications in the field of Micro-Electro-Mechanical Structures (MEMS). Our Micro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibrations of

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  • Recording --> Low-invasive Estimation of Actual Physical Properties in Microsystems Panelist: Dr. Swavik Spiewak Wednesday, 18-Aug-2010

    Model based estimation is usually the only option for low-invasive evaluation of the actual properties and performance of MNEMS either in the laboratory tests or in production.

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Technical Papers

Principle of our technology


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    Morphology, Flyability and Defects


    A presentation of the effects of disk morphology on the fly height modulation of the head-to-disk interface and the consequences of fly height modulation on disk defects.

    Publishing date: 07/2007
    Author: Jim Eckerman

    more information (107 KB / .pdf) »

    Testing for PMR Media


    This paper was presented at a Data Storage Institute hosted event to discuss the application of laser Doppler vibrometry applications in PMR media evaluation.

    Publishing date: 12/2006
    Author: Dr. Ian Freeman

    more information (496 KB / .pdf) »

    An Introduction to the Theory of Laser Vibrometry


    This is an introduction to the basics and theory of laser Doppler vibrometry measurement.

    Publishing date: 03/2006
    Author: David Oliver

    more information (414 KB / .pdf) »

    Targeting the Limits of Laser Doppler Vibrometry


    A discussion of the limits of measurement by laser Doppler vibrometry by theory and measurement.

    Publishing date: 10/2005
    Author: Martin Johansmann, Georg Siegmund and Mario Pineda

    more information (583 KB / .pdf) »



Latest News

Polytec announces the first morphology and defect tester based on advanced vibrometry.
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Polytec USA LLC was awarded the prestigious Nano Technology Award for Nano-Scan at the NASA sponsored National Nano Engineering Conference. This year’s winners include the THôT Model 42000 Scanner with Nano-Scan defect detection. Polytec Inc....
more information [Download PDF]