Polytec.llc

Events / Online Presentations

  • Recording --> Improving Performance of MEMS Designs Using Dynamic Characterization Panelist: Eric Lawrence Thursday, 18-Mar-2010

    Learn how Polytec's latest technology is used for cutting edge applications in the field of Micro-Electro-Mechanical Structures (MEMS). Our Micro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibrations of

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  • Recording --> Low-invasive Estimation of Actual Physical Properties in Microsystems Panelist: Dr. Swavik Spiewak Wednesday, 18-Aug-2010

    Model based estimation is usually the only option for low-invasive evaluation of the actual properties and performance of MNEMS either in the laboratory tests or in production.

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Service

The best engagement for our customers

  • Polytec LLC offers a variety of maintenance, test and support services. These
    services typically are in one of the following formats; maintenance, repair, user training, applications engineering, product test and data analysis. These services can be provided at the Polytec LLC facility or at the user site.

  • For any Service related questions please contact:

    Polytec LLC
    Service Center

    Frank Gleason
    Service Manager

    25 South Street, Ste A
    Hopkinton, MA 01748

    Phone: +1-508-417-1040
    Fax: +1-508-544-1225
    Cell: 508-287-5889

    info@polytec-llc.com

    Polytec LLC
    Service Center

    Kevin Carter
    Application Manager

    271 East Hacienda Avenue
    Campbell, CA 95008-6616

    Phone:+1-408-370-4605
    Fax:+1-408-370-4609

    info@polytec-llc.com

    Polytec LLC
    Service Center

    13th floor, Arena Tower, 3-1-9, Shinyokohama, Kohoku-ku, Yokohama-shi, Kanagawa, Japan, 226-0006     

    Phone: +81 (45) 478-6980
    Fax: +81 (45) 478-6981

    info@polytec.co.jp



Latest News

Polytec announces the first morphology and defect tester based on advanced vibrometry.
more information [Download PDF]




Polytec USA LLC was awarded the prestigious Nano Technology Award for Nano-Scan at the NASA sponsored National Nano Engineering Conference. This year’s winners include the THôT Model 42000 Scanner with Nano-Scan defect detection. Polytec Inc....
more information [Download PDF]