Polytec.llc

• Improving Performance of MEMS Designs Using Dynamic Characterization Panelist: Eric Lawrence Thursday, 18-Mar-2010

  Learn how Polytec's latest technology is used for cutting edge applications in the field of Micro-Electro-Mechanical Structures (MEMS). Our Micro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibrations of

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• Quality Control in the Production of Microsystems using Optical Measurement Methods for MEMS Testing on Waferlevel Panelist: Dr. Wilfried Bauer Thursday, 07-Oct-2010
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• AVT-1000 (english version)
  Advanced Vibrometry Tester download document (6 MB / .pdf)
  
• AVT-1000 (japanese version)
  Advanced Vibrometry Tester download document (521 KB / .pdf)
  

Polytec announces the first morphology and defect tester based on advanced vibrometry.
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Polytec USA LLC was awarded the prestigious Nano Technology Award for Nano-Scan at the NASA sponsored National Nano Engineering Conference. This year’s winners include the THôT Model 42000 Scanner with Nano-Scan defect detection. Polytec Inc....
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