Our Products
- Optical Surface Analyzer Technology for Nano-defect and Topography Measurements
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Events / Online Presentations
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Recording --> Improving Performance of MEMS Designs Using Dynamic Characterization
Panelist: Eric Lawrence
Thursday, 18-Mar-2010
Learn how Polytec's latest technology is used for cutting edge applications in the field of Micro-Electro-Mechanical Structures (MEMS). Our Micro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibrations of
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Recording --> Low-invasive Estimation of Actual Physical Properties in Microsystems
Panelist: Dr. Swavik Spiewak
Wednesday, 18-Aug-2010
Model based estimation is usually the only option for low-invasive evaluation of the actual properties and performance of MNEMS either in the laboratory tests or in production.
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Latest News
Polytec announces the first morphology and defect tester based on advanced vibrometry.
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Polytec USA LLC was awarded the prestigious Nano Technology Award for Nano-Scan at the NASA sponsored National Nano Engineering Conference. This year’s winners include the THôT Model 42000 Scanner with Nano-Scan defect detection. Polytec Inc....
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