Frequently Asked Questions
Its important to know where we can find answers ...
Question:
Can I use PSLs to calibrate the Polytec LLC tool?
The PSL Sphere Calibration as applied to Polytec LLC Testers
It has frequently been suggested that the Polytec LLC Testers be calibrated in a similar fashion to
Scatter Tools, by using a field of polystyrene latex (PSL) spheres of a known diameter.
more information (178 KB / .pdf)
Question:
How do the laser range settings work?
Laser Range Settings
The Polytec LLC tool is capable of measuring many features on a polished surface. The laser
system is very versatile and capable of measuring defects into the single Angstom range
and morphology from hundreds of microns to hundredths of Angstroms.
more information (10 KB / .pdf)
Question:
How do I set the power on the laser marker for my Defect Analysis Station?
Laser Marker Power Settings
The Photonic Instrument marking laser used on the Defect Analysis Station can be
adjusted to provide various levels of power for various materials, for example, nickel,
glass, carbon, aluminum, etc.
more information (192 KB / .pdf)
Question:
I have an older model morphology or defect tool, what are the improvements in the new tool?
Gain Bandwidth Improvement
New WTF (Wideband Tunable Filter) replacement for the FWT (Filtered Waviness Test).
With the new WTF board we greatly improved gain-bandwidth, the following example is
technically incorrect but serves as a very good example and explanation of the
improvement. To be strictly proper, “gain-bandwidth” can only be applied to amplifiers
and is a common specification for op amps.
more information (108 KB / .pdf)
Question:
How can the tool differentiate between pits and asperities?
Optical Glide / Optical Certification Discrimination
To provide the reader with an understanding of the defect detection method and
capability of the Polytec LLC Model 42000 disk inspection system including baseline references
and test thresholds.
more information (17 KB / .pdf)
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