Polytec.llc

• Recording --> Improving Performance of MEMS Designs Using Dynamic Characterization Panelist: Eric Lawrence Thursday, 18-Mar-2010

  Learn how Polytec's latest technology is used for cutting edge applications in the field of Micro-Electro-Mechanical Structures (MEMS). Our Micro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibrations of

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• Recording --> Low-invasive Estimation of Actual Physical Properties in Microsystems Panelist: Dr. Swavik Spiewak Wednesday, 18-Aug-2010

  Model based estimation is usually the only option for low-invasive evaluation of the actual properties and performance of MNEMS either in the laboratory tests or in production.

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• Home FAQ 

Frequently Asked Questions

Pages:3   Total Results:15    Result: [11 - 15]    Select Page: 1 | 2 | 3


Question:
How is the calibration established for the Power Spectral Density and Filtered Waviness Tests.



Filtered Waviness and PSD Calibration and Correlation
The understanding here is that the calibration / correlation project spanned several
years and what is reported here is the condensed version of “what worked”, a summary of
the efforts on all sides. Any blind alleys traveled down have been ignored unless a
valuable lesson was learned; in which case this “wrong path” is referenced in the
application note to warn the reader of potential pitfalls.
more information (85 KB / .pdf)





Question:
What tests should I use at various process stages?



Test Protocol
This document lays out the test protocol to demonstrate the capabilities of the Polytec LLC tool.
The purpose and a recommended protocol is outlined. A description of the standard tests
that are used to demonstrate the tool capabilities is provided. An explanation of the tool
test capabilities is given. A list of suggested tests is provided for various disk
manufacturing process stages.
more information (41 KB / .pdf)





Question:
What are the latest improvements for morphology tests?



Gain Bandwidth Improvement
With the new WTF board we greatly improved gain-bandwidth, the following example is
technically incorrect but serves as a very good example and explanation of the
improvement. To be strictly proper, “gain-bandwidth” can only be applied to amplifiers
and is a common specification for op amps.
more information (108 KB / .pdf)





Question:
Can the LDV make AFM type measurements?



AFM Simulation with Laser Doppler Vibrometry
A review of the paper “AFM versus Polytec LLC” will quickly show that the Polytec LLC
sector length is longer than the normal AFM measurement width. And, as can be easily
seen in that paper, the track spacing is also greater than the AFM “track."
more information (56 KB / .pdf)





Question:
How can I verify the AFM correlation?



Theoretical Calculations for Verification of Rq
We know that the tool can be adjusted with a basic calibration multiplier and baseline
offset to match any AFM measurements for Ra. We further know that the Rp
measurements will vary between the AFM and Polytec LLC tool to a high degree depending on
how the laser beam passes over the defect.
more information (88 KB / .pdf)




AFM Simulation with Laser Doppler Vibrometry
A review of the paper "AFM verses Polytec LLC" will quickly show that the Polytec LLC
sector length is longer than the normal AFM measurement width. And, as can be easily
seen in that paper, the track spacing is also greater than the AFM "track."
more information (56 KB / .pdf)

Polytec announces the first morphology and defect tester based on advanced vibrometry.
more information [Download PDF]

Polytec USA LLC was awarded the prestigious Nano Technology Award for Nano-Scan at the NASA sponsored National Nano Engineering Conference. This year’s winners include the THôT Model 42000 Scanner with Nano-Scan defect detection. Polytec Inc....
more information [Download PDF]