Polytec.llc

• Recording --> Improving Performance of MEMS Designs Using Dynamic Characterization Panelist: Eric Lawrence Thursday, 18-Mar-2010

  Learn how Polytec's latest technology is used for cutting edge applications in the field of Micro-Electro-Mechanical Structures (MEMS). Our Micro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibrations of

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• Recording --> Low-invasive Estimation of Actual Physical Properties in Microsystems Panelist: Dr. Swavik Spiewak Wednesday, 18-Aug-2010

  Model based estimation is usually the only option for low-invasive evaluation of the actual properties and performance of MNEMS either in the laboratory tests or in production.

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• Home FAQ 

Frequently Asked Questions

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Question:
Will the Polytec LLC tool replace my AFM?



AFM vs Polytec LLC Resolution
The Atomic Force Microscope is an analytical tool capable of imaging
very small features so that the feature structure and composition can be analyzed. The Polytec LLC Photonic Force Microscope is capable of scanning large areas and detect the
presence of very small features.

The Polytec LLC tool will never replace the AFM for critical defect analysis and the AFM will
never be capable of full disk surface examination.
more information (67 KB / .pdf)




AFM Simulation with Laser Doppler Vibrometry
A review of the paper "AFM versus Polytec LLC" shows that the Polytec LLC
sector length is longer than the normal AFM measurement width. Also, as can be easily
seen in that paper, the track spacing is also greater than the AFM "track."

However, in vertical resolution, the LDV easily exceeds the measurement
capability, accuracy and repeatability of the AFM. To understand how this is possible it is
necessary to understand the inner workings of the LDV.
more information (56 KB / .pdf)





Question:
How does the LDV work?



Doppler Vibrometer Principles Video
In the following Video we want to ilustrate the principle of the Laser Doppler Vibrometry.
more information (5 MB / .wmv)





Question:
If nano-defects are below the optical limit, how do we know they are there?



Disk Rotation and Defect Repeatability
Two disks were tested. One was tested for nano-asperities and the other for nano-pits ...
more information (101 KB / .pdf)




Disk test threshold and defect repeatability.
The following defect plots show the effects of an increasingly more
stringent test threshold ...
more information (273 KB / .pdf)




Defect Separation by Height and Depth
The following is a graphic example of the ability of the Polytec LLC Nano-Scan tool to separate height and depth ...
more information (40 KB / .pdf)





Question:
How do Gain settings affect my Optical Glide and Optical Certification data?



Gains and Measurements
The Polytec LLC tool is designed to be very versatile. This means that we need to be able to
detect and measure many different size defects on a variety of surfaces.
more information (25 KB / .pdf)





Question:
My dual sided system has different laser beam intensities, how will this affect my readings?



Laser Beam Intensity
The question often arises concerning laser beam intensity and more specifically, the issue
on a dual sided tester about the difference between the two beams.
more information (12 KB / .pdf)




Doppler Vibrometer Principles Video
more information (5 MB / .wmv)

Polytec announces the first morphology and defect tester based on advanced vibrometry.
more information [Download PDF]

Polytec USA LLC was awarded the prestigious Nano Technology Award for Nano-Scan at the NASA sponsored National Nano Engineering Conference. This year’s winners include the THôT Model 42000 Scanner with Nano-Scan defect detection. Polytec Inc....
more information [Download PDF]