Polytec.llc

• Recording --> Improving Performance of MEMS Designs Using Dynamic Characterization Panelist: Eric Lawrence Thursday, 18-Mar-2010

  Learn how Polytec's latest technology is used for cutting edge applications in the field of Micro-Electro-Mechanical Structures (MEMS). Our Micro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibrations of

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• Recording --> Low-invasive Estimation of Actual Physical Properties in Microsystems Panelist: Dr. Swavik Spiewak Wednesday, 18-Aug-2010

  Model based estimation is usually the only option for low-invasive evaluation of the actual properties and performance of MNEMS either in the laboratory tests or in production.

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• Recording --> Low-invasive Estimation of Actual Physical Properties in Microsystems

  
  Panelist: Dr. Swavik Spiewak
  
  Wednesday, 18-Aug-2010
  

  Model based estimation is usually the only option for low-invasive evaluation of the actual properties and performance of MNEMS either in the laboratory tests or in production.
  
  more information / online registration

Polytec announces the first morphology and defect tester based on advanced vibrometry.
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Polytec USA LLC was awarded the prestigious Nano Technology Award for Nano-Scan at the NASA sponsored National Nano Engineering Conference. This year’s winners include the THôT Model 42000 Scanner with Nano-Scan defect detection. Polytec Inc....
more information [Download PDF]